A Kalman filter for validate points and areas of constant depth in the acquisition of the profile surfaces

By Fonseca, J; Martins, J; Couto, C; Franquelo, LG; Malinowski, A; Chow, MY; Hess, HL

Iecon 2005: Thirty-First Annual Conference of the Ieee Industrial Electronics Society, Vols 1-3



No abstract available.

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