Evaluation of Adherence to the Model Six Sigma Using Paraconsistent Logic

By Kirilo, C.Z.; Abe, J.M.; Nogueira, M.; Nakamatsu, K.; Lozano, L.C.M.&a

2018 IEEE (SMC) International Conference on Innovations in Intelligent Systems and Applications, INISTA 2018

2018

Abstract

No abstract available.

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